Semiconductor integrated circuit test head

Details Semiconductor integrated circuit test head Semiconductor integrated circuit test head

2005-11-29

2005-11-29

Davis, Antoine D. (Department: 2915)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0511981

CLAIM:
The ornamental design for a semiconductor integrated circuit test head, as shown and described.

REFERENCES:
patent: D345705 (1994-04-01), Nesbitt et al.
patent: D369983 (1996-05-01), Fisher et al.
patent: 6642729 (2003-11-01), Kang et al.

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