Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2007-12-06
2009-06-23
Jeanglaude, Jean B (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S172000, C341S161000, C341S155000, C341S169000
Reexamination Certificate
active
07551116
ABSTRACT:
A semiconductor integrated circuit includes a differential amplifier circuit receiving first and second input voltages, a latch circuit comparing a voltage received from a first output terminal of the differential amplifier circuit through a first capacitor and a voltage received from the second output terminal of the differential amplifier circuit through a second capacitor and providing a digital signal representing a result of a comparison between the first and second input voltages, and a third capacitor having a first terminal coupled to a second terminal of the first capacitor and a second terminal coupled to a second terminal of the second capacitor.
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Nishikawa Kazuyasu
Tomisawa Jun
Jeanglaude Jean B
Mitsubishi Electric Corporation
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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