Coded data generation or conversion – Analog to or from digital conversion – Nonlinear
Reexamination Certificate
2007-02-06
2007-02-06
Nguyen, Linh (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Nonlinear
C341S142000, C341S155000
Reexamination Certificate
active
10807450
ABSTRACT:
An output voltage of a VDC circuit is subjected to A/D conversion with an on-chip A/D converter. Accordingly, an output voltage VDCout of the VDC circuit can be observed as a digital value, which facilitates measurement. Reduction in the number of terminals leads to reduction in chip size. In addition, the terminal that has been used for providing voltage VDCout can be used for other purposes. Therefore, a semiconductor integrated circuit allowing for easy mass production test and reduced number of man-hours in the mass production test can be provided.
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German Office Action dated Mar. 29, 2006 with English-language translation.
Nakano Tadayoshi
Nasu Takashi
Buchanan & Ingersoll & Rooney PC
Nguyen Linh
Renesas Technology Corp.
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