Semiconductor integrated circuit having test circuit

Details Semiconductor integrated circuit having test circuit Semiconductor integrated circuit having test circuit

1991-12-19

1995-05-23

Beausoliel, Jr., Robert W.

Excavating

371 48, H04B 1700, G06F 1100

Patent

active

054187915

ABSTRACT:
A semiconductor integrated circuit includes a plurality of data buses, and emitter-follower circuits arranged in the data buses. Read parts, which are coupled to the emitter-follower circuits, read data transferred via the data buses via the emitter-follower circuits. A test part, which is coupled to the emitter-follower circuits, determines, in a test mode, whether or not the data transferred via the data buses have an error and outputs a test output signal to one of the data buses. The output test signal has a potential level higher than that of the data transferred via the data buses in a normal mode.

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