Semiconductor integrated circuit having self-check and self-repa

Details Semiconductor integrated circuit having self-check and self-repa Semiconductor integrated circuit having self-check and self-repa

1991-04-16

1994-01-11

Atkinson, Charles E.

Excavating

371 212, G01R 3128

Patent

active

052788393

ABSTRACT:
A semiconductor integrated circuit which has the function of self-checking defective bits, and which informs the exterior of its status when it has reached the status incapable of self-repair due to the limitation of the storage capacity of hardware for repairing the defective bits.

REFERENCES:
patent: 4412281 (1983-10-01), Works
patent: 4656610 (1987-04-01), Yoshida et al.
patent: 4667330 (1987-05-01), Kumagai
patent: 4827452 (1989-05-01), Toyama et al.
patent: 4905142 (1990-02-01), Matsubara et al.
patent: 5138619 (1992-08-01), Fasang et al.
IEEE 1989 Custom Integrated Circuits Conference, "Built-In Self-Repair Circuit for High-Density ASMIC", K. Sawada et al, pp. 26.1.2-26.1.4.

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