Semiconductor integrated circuit having multiple...

Details Semiconductor integrated circuit having multiple... Semiconductor integrated circuit having multiple...

2006-10-26

2008-12-16

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07466159

ABSTRACT:
A semiconductor integrated circuit includes: a package; semiconductor chips in the package including a signal terminal; and a wiring connecting signal terminals. One semiconductor chip is a test object chip including a probe terminal and a test object terminal. The probe terminal connects to an external terminal for testing the test object terminal. The test object chip further includes: a common wiring for connecting the probe terminal and the test object terminal; a first switch for connecting/disconnecting the probe terminal and the common wiring; a second switch for connecting/disconnecting the test object terminal and the common wiring; and a test signal interrupting element for interrupting the test signal to be inputted into an input circuit of the probe terminal.

REFERENCES:
patent: 5712576 (1998-01-01), Nagataki
patent: 6885212 (2005-04-01), Yamamoto et al.
patent: 7030639 (2006-04-01), Ueminami et al.
patent: 2005/0156589 (2005-07-01), Yamamoto et al.

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