Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1991-10-01
1993-12-14
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324501, G01R 3128
Patent
active
052706559
ABSTRACT:
The light emitting device has a series circuit comprised of a MOS transistor and a P.sup.+ N.sup.+ junction. When a voltage greater than the breakdown voltage of the P.sup.+ N.sup.+ junction is applied to this series circuit, as well as putting the MOS transistor into a conductive state, the P.sup.+ N.sup.+ junction breaks down allowing a breakdown current to flow, and weak light is generated from the P.sup.+ N.sup.+ junction. Since this light emitting device can be produced in nearly the same size as an MOS transistor, using a conventional CMOS technique, it can be integrated into a chip with a high integration level, and the integration of the light emitting device causes almost no drop in the integration level. When this light emitting device is integrated in a semiconductor integrated circuit, the state of the circuit can be easily monitored by observing the light pattern of the device.
REFERENCES:
patent: 3991302 (1976-11-01), Danner
patent: 4389669 (1983-06-01), Epstein et al.
patent: 4680635 (1987-07-01), Khurana
patent: 4755874 (1988-07-01), Esrig et al.
patent: 4758782 (1988-07-01), Kobayashi
patent: 4999577 (1991-03-01), Beha et al.
Karlsen Ernest F.
Matsushita Electric - Industrial Co., Ltd.
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