Semiconductor integrated circuit having I/O terminals allowing i

Details Semiconductor integrated circuit having I/O terminals allowing i Semiconductor integrated circuit having I/O terminals allowing i

1989-10-16

1991-04-30

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 226, G01R 3128

Patent

active

050121855

ABSTRACT:
A semiconductor integrated circuit comprises a plurality of input/output terminals, a test mode input circuit having a mode setting input and for generating a mode control signal, a plurality of test buffer circuits provided for the input/output terminals in one-to-one relation and each having a first terminal connected to a corresponding input/output terminal and a second terminal connected to receive a signal to be supplied to the corresponding input/output terminal or to output a signal inputted through the corresponding input/output terminal. Each test buffer circuit also includes a mode control input connected to receive the mode control signal from the test mode input circuit. When the mode control signal is in a first condition, each test buffer circuit operates to supply a predetermined logical to the corresponding input/output terminal so that the predetermined logical signal is outputted from all the input/output terminals. When the mode control signal is in a second condition different from the first condition, each test buffer circuit operates to output a signal supplied to the first or second terminal to the second or first terminal.

REFERENCES:
patent: 4339710 (1982-07-01), Hapke
patent: 4743841 (1988-05-01), Takeuchi

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