Semiconductor integrated circuit having function for evaluating

Details Semiconductor integrated circuit having function for evaluating Semiconductor integrated circuit having function for evaluating

1997-03-26

1998-10-13

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

327437, 327 23, 327 24, 327 41, 327262, H03K 3353

Patent

active

058217860

ABSTRACT:
A semiconductor integrated circuit, having circuit blocks to be evaluated in AC performance, includes a first circuit for inputting a first signal and a second signal generated in the interior of the semiconductor integrated circuit. The first circuit outputs a transient current when the first signal and the second signal change simultaneously. In the semiconductor integrated circuit, the transient current (third signal) is output to a external terminal of the semiconductor integrated circuit for evaluating the AC performance of the block.

REFERENCES:
patent: 4785204 (1988-11-01), Terada et al.
patent: 5321354 (1994-06-01), Ooshima et al.

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