Semiconductor integrated circuit having a DC test function

Details Semiconductor integrated circuit having a DC test function Semiconductor integrated circuit having a DC test function

1988-12-01

1990-02-27

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307603, 3072965, 307594, 3072721, 371 12, 371 225, H03K 1722, H03K 3013, H03K 3027, G01R 3128

Patent

active

049048830

ABSTRACT:
An integrated circuit receiving an input signal and producing output signal including: a set/reset circuit, operatively connected to an internal main circuit, being set in response to the first signal and reset in response to the second signal in a normal mode; an output buffer circuit, connected to the set/reset circuit, for producing the output signal in response to an output of the set/reset circuit; and a control circuit, connected between the internal main circuit and the set/reset circuit, receiving the first signal, a reset signal for initializing the internal main circuit, the first signal, the second signal, and a first test signal, during a DC test mode, the control circuit resetting the set/reset circuit in response to a receipt of the reset signal regardless of the second signal and setting the set/reset circuit in response to a receipt of the first test signal regardless of the reset signal and the first signal.

REFERENCES:
patent: 4410991 (1983-10-01), Lenart
patent: 4546472 (1985-10-01), Volk et al.
patent: 4551841 (1985-11-01), Fujita et al.
patent: 4583041 (1986-04-01), Kimura
patent: 4803682 (1989-02-01), Harg et al.
patent: 4843592 (1989-06-01), Tsuaki et al.

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