Semiconductor integrated circuit having a built-in voltage gener

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307358, 307360, H03K 301, H03K 5153

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active

049509217

ABSTRACT:
An integrated circuit provided with a test scheme for allowing a control of the voltage applied to internal circuit elements is disclosed and includes a functional circuit, an internal voltage generator generating an internal operating voltage for the functional circuit from an externally applied power voltage, a switch for selectively applying the externally applied power voltage to the functional circuit, and a control circuit for controlling the switch.

REFERENCES:
patent: 4709165 (1987-11-01), Higuchi et al.
patent: 4709172 (1987-11-01), Williams
patent: 4806788 (1989-02-01), Tobita
patent: 4812680 (1989-03-01), Kawashima et al.
patent: 4825018 (1989-04-01), Okada et al.
"The World of Silicon: Its Dog Eat Dog", IEEE Spectrum, Sep. 1988, pp. 30-39, by Brian Santo et al.
"Chip Voltage: Why Less is Better", IEEE Spectrum, Apr. 1987, Sunlen ehou et al.

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