Semiconductor integrated circuit equipped with diagnostic circui

Details Semiconductor integrated circuit equipped with diagnostic circui Semiconductor integrated circuit equipped with diagnostic circui

1992-06-22

1994-02-15

Zazworsky, John

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307350, 307303, 3072964, H03K 524, H03K 301

Patent

active

052870120

ABSTRACT:
An internal step-down circuit is incorporated in an integrated circuit device for reduction in power consumption as well as for scaling-down, and produces an internal step-down power voltage level regulated to a reference voltage level internally produced by an internal reference signal generator, wherein a diagnostic circuit compares the reference voltage level with an external variable voltage level to see if or not the reference voltage level is higher than the external voltage level, and the external variable voltage level is changed to determine the matching point therebetween, thereby confirming the reference voltage level after packaging.

REFERENCES:
patent: 4950921 (1990-08-01), Takada
patent: 5132555 (1992-07-01), Takahashi
patent: 5184031 (1993-02-01), Hayakawa et al.

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