Semiconductor integrated circuit devices and methods for testing

Details Semiconductor integrated circuit devices and methods for testing Semiconductor integrated circuit devices and methods for testing

1986-09-26

1989-11-14

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73PC, 357 68, 29827, 437 8, G01R 3100, G01R 3102

Patent

active

048810290

ABSTRACT:
A semiconductor integrated circuit device, comprises a semiconductor integrated circuit chip having a plurality of signal wires and a plurality of test terminals connected to said signal wires. The test terminals are concentrated in at least one selected circuit area of the semiconductor integrated circuit chip to permit chip diagnosis using an image mode electron beam detector.

REFERENCES:
patent: 4417393 (1983-11-01), Becker
patent: 4587549 (1986-05-01), Ushiku
patent: 4685033 (1987-08-01), Inoue
"Multilayer Ceramic Fixed Layer Substrate Design", by Johnson et al., IBM Tech. Disc. Bull., vol. 22, #5, 10/79, pp. 1841-1842.
"Wirability Enhancement", by Jarvela et al., IBM Tech. Disc. Bull., vol. 21, #9, 2/79, p. 3624.
"Pin Attachment Structure for Multilayer Ceramic Substrates", by Kim, vol. 20, #11A, 4/78, p. 4333, IBM Tech. Disc. Bull.

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