Semiconductor integrated circuit device with test circuit

Details Semiconductor integrated circuit device with test circuit Semiconductor integrated circuit device with test circuit

1986-11-19

1988-04-19

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 21, 371 25, G01R 3128

Patent

active

047392509

ABSTRACT:
A semiconductor integrated circuit device with a test circuit including: a plurality of basic gate cells arranged in a matrix; wiring connected between the basic gate cells and arranged so as to constitute a logic circuit; and a test circuit for checking an operation state of each gate cell and a connection state between basic gate cells. The test circuit comprises: a test input section having a plurality of row selection wires provided along the basic gate cells in a row direction, a plurality of column selection wires provided along the basic gate cells in a column direction, and an access circuit connected to an input portion of the basic gate cell for applying an input signal to the basic gate cell optionally selected by the row and column selection wires; and a test direction section having a plurality of monitor wires provided along the basic gate cells in the row direction and a switching element connected between the basic gate cell and the monitor wire.

REFERENCES:
patent: 3958110 (1976-05-01), Hong et al.
patent: 4499579 (1985-02-01), Still et al.

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