Semiconductor integrated circuit device, measurement method...

Details Semiconductor integrated circuit device, measurement method... Semiconductor integrated circuit device, measurement method...

2007-04-02

2008-07-15

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C368S118000, C714S731000

Reexamination Certificate

active

07400160

ABSTRACT:
Disclosed is an AC characteristics measurement system that includes a flip-flop arranged in a loop of a ring oscillator; a clock generating circuit that receives a signal propagated in said loop of said ring oscillator and generates a clock signal to be supplied to said flip-flop; a delay adjustment circuit that receives a signal propagated in said loop of said ring oscillator and generates a data signal to be supplied to said flip-flop and that receives a control signal and variably controls the time difference between a transition edge of said data signal to be supplied to said flip-flop and an effective edge of said clock signal to be supplied to said flip-flop, based on said control signal; and a setup-hold changeover circuit that is provided at a preceding stage of said flip-flop and that switches the temporal before and after relation between a transition edge of said data signal supplied to said flip-flop and an effective edge of said clock signal, responsive to a control signal for performing changeover between the measurements of setup time and hold time. An AC measured value is derived from the value of the control signal at a time point of cessation of oscillation of a preset node of the loop.

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