Patent
1979-09-07
1981-08-11
James, Andrew J.
357 65, 357 67, 357 59, 357 51, 357 35, 357 36, H01L 2348, H01L 2944, H01L 2952
Patent
active
042837332
ABSTRACT:
A semiconductor device includes terminals for use in monitoring characteristics of circuit elements formed therein. The terminals are formed of a layer of polycrystalline silicon and terminate in an enlarged area pad portion adapted to be contacted by a probe of an external characteristics-monitoring apparatus.
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James Andrew J.
Nippon Electric Co. Ltd.
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