Semiconductor integrated circuit device having rest function

Details Semiconductor integrated circuit device having rest function Semiconductor integrated circuit device having rest function

1987-08-03

1988-10-25

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 324 73AT, 371 20, 371 25, G01R 1512

Patent

active

047806664

ABSTRACT:
A semiconductor integrated circuit device includes a plurality of latch circuits which are provided between adjacent circuit blocks. Each latch circuit functions to transfer output data from a preceding circuit block directly to a subsequent circuit block during a normal operation of the circuit device, to hold the output data until a scanning of associated scan register and supply them to the subsequent circuit block in a scan mode of a test operation and to hole the output data while outputting them in synchronism with an external clock in a test mode of the test operation.

REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4493077 (1985-01-01), Agrawal et al.
patent: 4602210 (1986-07-01), Fasang et al.

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