Semiconductor integrated circuit device having pads...

Details Semiconductor integrated circuit device having pads... Semiconductor integrated circuit device having pads...

2007-01-04

2008-08-05

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07408368

ABSTRACT:
A semiconductor device is provided with test-subject circuit1, test-irrelevant circuit2, first pads used for the test-subject circuit, and second pads used for the test-irrelevant circuit. The first pads include a plurality of divided pad portions while each of the second pads is provided with a single pad portion.

REFERENCES:
patent: 5506499 (1996-04-01), Puar
patent: 5554940 (1996-09-01), Hubacher
patent: 6002267 (1999-12-01), Malhotra et al.
patent: 6288346 (2001-09-01), Ojiri et al.
patent: 6721920 (2004-04-01), Rearick et al.
patent: 6731128 (2004-05-01), Das et al.
patent: 8-29451 (1996-02-01), None

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