Semiconductor integrated circuit device having overcurrent...

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific current responsive fault sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S103000

Reexamination Certificate

active

08004809

ABSTRACT:
A semiconductor integrated circuit device includes an output transistor, an overcurrent detection circuit and overcurrent limitation circuit. The overcurrent detection circuit includes a first transistor detecting an overcurrent of the output transistor. The overcurrent limitation circuit is connected between a gate and a source of the output transistor. The overcurrent limitation circuit includes a plurality of resistance elements and a diode connected in series between the gate and the source of the output transistor in series, and a second transistor whose gate is connected to a connection point between the resistance elements and that is cascade connected to the first transistor.

REFERENCES:
patent: 5303110 (1994-04-01), Kumagai
patent: 6538480 (2003-03-01), Takada et al.
patent: 7012792 (2006-03-01), Yoshida
patent: 7158359 (2007-01-01), Bertele et al.
patent: 2003/0117758 (2003-06-01), Yoshida
patent: 2003-197913 (2003-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor integrated circuit device having overcurrent... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device having overcurrent..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device having overcurrent... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2706139

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.