Semiconductor integrated circuit device having input circuit wit

Details Semiconductor integrated circuit device having input circuit wit Semiconductor integrated circuit device having input circuit wit

1996-01-31

1998-01-27

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

371 226, G01R 3102

Patent

active

057125767

ABSTRACT:
A semiconductor integrated circuit device receives an input signal from an external wiring through an input transistor coupled to one of external leads, and a transfer gate is coupled between the external lead and a constant voltage source so as to provide a terminal resistance to the external wiring; however, the transfer gate is turned off in a test to see whether or not the input transistor is defective so as to enhance the reliability of the diagnosis.

REFERENCES:
patent: 4743841 (1988-05-01), Takeuchi
patent: 5485095 (1996-01-01), Bertsch et al.

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