Semiconductor integrated circuit device having failure detection

Details Semiconductor integrated circuit device having failure detection Semiconductor integrated circuit device having failure detection

1996-11-04

1999-04-06

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3128

Patent

active

058923683

ABSTRACT:
A 12.5-MHz signal is applied from outside a semiconductor integrated circuit (SIC) device to a signal input terminal of that SIC device. A frequency multiplying circuit is fed that 12.5-MHz signal from the input terminal, and delivers a reference signal whose frequency is a multiple of the frequency of the signal received (i.e., 100 MHz), to a semiconductor memory and to a self-test circuit. The self-test circuit provides a test signal in synchronism with that 100-MHz reference signal to the semiconductor memory for testing for the presence or absence of a failure. All elements of the semiconductor memory are tested by the self-test circuit for a failure. If the self-test circuit finds a semiconductor memory element that fails to work properly, it provides a signal indicative of such failure to a failure counting circuit. This failure counting circuit counts the number of times the self-test circuit provides such a signal.

REFERENCES:
patent: 4414665 (1983-11-01), Kimura et al.
patent: 4853628 (1989-08-01), Gouldsberry et al.
patent: 4872168 (1989-10-01), Aadsen et al.
patent: 4939694 (1990-07-01), Eaton et al.
patent: 4961053 (1990-10-01), Krug
patent: 5097205 (1992-03-01), Yoyoda
patent: 5248936 (1993-09-01), Nakata et al.
patent: 5313424 (1994-05-01), Adams et al.
patent: 5381087 (1995-01-01), Hirano
patent: 5404359 (1995-04-01), Gillenwater et al.
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5757705 (1998-05-01), Manning

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device having failure detection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device having failure detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device having failure detection will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1374555