Semiconductor integrated circuit device equipped with scan-pass

Details Semiconductor integrated circuit device equipped with scan-pass Semiconductor integrated circuit device equipped with scan-pass

1989-03-31

1990-04-10

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 223, G01R 3128, G01R 1512

Patent

active

049163884

ABSTRACT:
A semiconductor integrated circuit device is disclosed, which includes a test circuit for facilitating A.C. characteristic test thereof. This test circuit includes a delay circuit, a first register for temporarily storing test data to be supplied to the delay circuit and a second register for temporarily storing data derived from the delay circuit. The delay circuit has a delay time approximately equal to a data propagation delay time on a critical path formed in the integrated circuit device. The device also includes a scan pass type test circuit for a function test thereof. The scan-in terminal is used to supply the test data to the first register and the scan-out terminal is used to receive data from the second register.

REFERENCES:
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4701922 (1987-10-01), Kuboki et al.
patent: 4780666 (1988-10-01), Sakashita et al.
patent: 4796095 (1989-01-01), Shimada

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device equipped with scan-pass does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device equipped with scan-pass , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device equipped with scan-pass will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2301143