Semiconductor integrated circuit device and test method therefor

Details Semiconductor integrated circuit device and test method therefor Semiconductor integrated circuit device and test method therefor

1992-12-29

1994-11-22

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3128

Patent

active

053672631

ABSTRACT:
A semiconductor integrated circuit device includes individual circuit blocks which are tested according to the method of the invention. Circuit blocks of a semiconductor integrated circuit device may be tested independently of one another until all circuit blocks have been tested, or alternatively may be simultaneously tested. The multi-test method of the invention simultaneously tests plural semiconductor integrated circuit devices by successively testing corresponding circuit blocks on each semiconductor integrated circuit device. The test apparatus of the present invention is of minimal size and complexity, and greatly enhances testability of a semiconductor integrated circuit device.

REFERENCES:
patent: 4038648 (1977-07-01), Chesley
patent: 4479088 (1984-10-01), Stopper
patent: 4956602 (1990-09-01), Parrish
patent: 4961053 (1990-10-01), Krug
patent: 5059899 (1991-10-01), Farnworth et al.

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