Semiconductor integrated circuit device and semiconductor...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Current driver

Reexamination Certificate

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Details

C327S112000, C327S424000, C318S430000, C318S434000

Reexamination Certificate

active

11116220

ABSTRACT:
A semiconductor integrated circuit device according to the present invention includes: a sample circuit in which through current to be monitored flows during switching between transistors; a non-overlap circuit for outputting an output signal for the switching in the sample circuit; a current detector for detecting the through current flowing during the switching; and a current comparator in which a reference current value with respect to the through current has been set and which compares a current value detected by the current detector with the reference current value and outputs a result of the comparison to the non-overlap circuit.

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patent: 7084594 (2006-08-01), Itabashi et al.
patent: 63-169120 (1988-07-01), None

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