Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-05-13
2008-05-13
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S764010
Reexamination Certificate
active
10569043
ABSTRACT:
A semiconductor integrated circuit device, i.e. a reset IC(1), includes: a detection circuit (4) for detecting whether an input voltage (Vin) has risen or dropped by comparing the input voltage (Vin) with a reference voltage; a delay circuit (8) for delaying a start-up voltage detection signal from the detection circuit (4) by charging a capacitor (C) connected thereto via a connection terminal (CT), and discharging the capacitor (C) by receiving an output signal (Vout) of a first voltage; a retention circuit (9) for retaining a start-up voltage detection signal delayed by the delay circuit (8); and a driver (10) for generating an output signal (Vout) that becomes a first voltage by a start-up voltage detection signal retained by the retention circuit (9), and generating an output signal (Vout) that becomes a second voltage by a voltage drop detection signal from the detection circuit (4).
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Fish & Richardson P.C.
Hollington Jermele
Rohm & Co., Ltd.
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