Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2005-06-07
2005-06-07
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S777000
Reexamination Certificate
active
06903453
ABSTRACT:
A semiconductor integrated circuit device includes: a first semiconductor chip including a CPU and a debug basic circuit section for verifying operation of a program executed by the CPU; and a second semiconductor chip retained over a principal surface of the first semiconductor chip and including a debug extension circuit section electrically connected to the CPU and the debug basic circuit section. The debug basic circuit section includes a debug command analyzing section for analyzing a command input from outside. The debug extension circuit section formed in the second semiconductor chip includes a debugging function circuit section including at least one debug circuit.
REFERENCES:
patent: 6356960 (2002-03-01), Jones et al.
patent: 6526501 (2003-02-01), Edwards et al.
patent: 6697931 (2004-02-01), Jones et al.
patent: 2002/0091494 (2002-07-01), Kudo
Mikami Tsutomu
Miyawaki Kouichirou
Nishibata Motohide
Ubukata Atsushi
Yamashita Takio
Andujar Leonardo
Flynn Nathan J.
McDermott Will & Emery LLP
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