Semiconductor integrated circuit device, and adjustment...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage

Reexamination Certificate

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C327S525000

Reexamination Certificate

active

06943616

ABSTRACT:
It is intended to provide a semiconductor integrated circuit device and adjustment method of the same semiconductor integrated circuit device, capable of adjusting an analog signal outputted from an incorporated analog signal generating section without outputting it outside as an analog value. An analog signal AOUT is outputted from an analog signal generating section3in which an adjustment signal AD is inputted. The analog signal AOUT is inputted to a judgment section1, in which it is compared and judged with a predetermined value and then a judgment signal JG is outputted. The judgment signal JG acts on a predetermined signal storing section4as an internal signal and the adjustment signal AD is fetched into the predetermined signal storing section4. Further, the judgment signal JG is outputted as digital signal through an external terminal T2and an external tester device acquires the adjustment signal and stores the acquired adjustment signal in the predetermined signal storing section4. Consequently, the analog signal can be adjusted as analog value without being outputted outside and an adjustment test can be carried out with a simple tester device and according to a simple test method accurately and rapidly.

REFERENCES:
patent: 6414535 (2002-07-01), Ooishi
patent: 11-044736 (1999-02-01), None
patent: 2001-229697 (2001-08-01), None

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