Patent
1988-02-24
1990-12-25
James, Andrew J.
357 43, 357 2312, 357 48, H01L 2702
Patent
active
049807447
ABSTRACT:
An improved arrangement is provided for forming a bipolar transistor on a substrate with CMOS elements. All of the transistors (i.e., the bipolar, P-MOS and N-MOS) are formed in regions having gradually decreasing impurity concentrations from the surface toward the substrate. In addition, a buried layer is provided under each of the regions of decreasing impurity concentration in which the transistors are formed. These buried layers have a significantly higher impurity concentration than the portion of the region of decreasing impurity concentration which they are respectively adjacent to. Using this arrangement, punch-through is prevented and excellent electrical operating characteristics are provided for both the bipolar transistors and the CMOS elements.
REFERENCES:
patent: 4528581 (1985-07-01), Lee
patent: 4724221 (1988-02-01), Jochems
Parillo, L. C., et al. Twin-Tub CMOS: A Technology for VLSI Circuits, IEDM, 1980, pp. 752-755.
Hirao Mitsuru
Ikeda Takahide
Kamei Tatsuya
Mukai Touji
Tsukuda Kiyoshi
Crane Sara W.
Hitachi , Ltd.
James Andrew J.
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