Fishing – trapping – and vermin destroying
Patent
1988-03-31
1990-05-01
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 34, 437 59, 437 41, 357 43, H01L 21265
Patent
active
049218115
ABSTRACT:
An improved arrangement is provided for forming a bipolar transistor on a substrate with CMOS elements. All of the transistors (i.e., the bipolar, P-MOS and N-MOS) are formed in regions having gradually decreasing impurity concentrations from the surface toward the substrate. In addition, a buried layer is provided under each of the regions of decreasing impurity concentration in which the transistors are formed. These buried layers have a significantly higher impurity concentration than the portion of the region of decreasing impurity concentration which they are respectively adjacent to. Using this arrangement, punch-through is prevented and excellent electrical operating characteristics are provided for both the bipolar transistors and the CMOS elements.
REFERENCES:
patent: 3702428 (1972-11-01), Schmitz et al.
patent: 3930909 (1976-01-01), Schmitz et al.
patent: 3935040 (1976-01-01), Mason
patent: 4007478 (1977-02-01), Yagi
patent: 4203126 (1980-05-01), Yim et al.
patent: 4233615 (1980-11-01), Takemoto
patent: 4249970 (1981-02-01), Briska et al.
patent: 4258379 (1981-03-01), Watanabe
patent: 4435895 (1984-03-01), Parrillo et al.
patent: 4476480 (1984-10-01), Fuse
patent: 4484388 (1984-11-01), Iwasaki
patent: 4510676 (1985-04-01), Anantha et al.
patent: 4529456 (1985-07-01), Anzai et al.
patent: 4571275 (1986-02-01), Moskvold
Castrucci et al, "Biplar/Fet . . . ", IBM TDB, vol. 16, No. 8, Jan. '74, pp. 2719-2720.
Heinig et al, "BiMOS . . . " Proc. of 1981 Custom IC Conf. 5/81, pp. 8-12.
Vora, M. "FET-Bipolar Integration", IBM TDB, vol. 13, No. 5, 10/70, pp. 1106.
Su et al., "A New . . . Structure", IEEE J. Sol. Stat. Cir., Apr. 1 '72, pp. 170-171.
Hirao Mitsuru
Ikeda Takahide
Kamei Tatsuya
Mukai Touji
Tsukuda Kiyoshi
Hearn Brian E.
Hitachi , Ltd.
McAndrews Kevin
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