Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1982-12-27

1985-10-29

Levy, Stewart J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3122

Patent

active

045502897

ABSTRACT:
A semiconductor integrated circuit (IC) device includes therein a test circuit. The test circuit operates to distinguish the power source level during the testing or ground level occurring at an internal node located inside the semiconductor chip. The test circuit includes a series-connected MIS transistor and an MIS diode. The gate of the MIS transistor is connected to the internal node. The MIS diode is connected to an external input/output (I/O) pin. The level at the internal node, i.e., the power source level or the ground level, can be distinguished by a first voltage level or a second voltage level applied to the external I/O pin, whichever enables a current to be drawn from the external I/O pin.

REFERENCES:
patent: 3851161 (1974-11-01), Sloop
patent: 4241307 (1980-12-01), Hong
patent: 4336495 (1982-06-01), Hapke
patent: 4395767 (1983-07-01), Van Brunt et al.
Collins, "Logic Network Nodal Conductance", IBM Tech. Disc. Bull. vol. 17, No. 12, May 1975, pp. 3666-3668.

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