Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

2006-08-01

2006-08-01

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07084658

ABSTRACT:
A semiconductor integrated circuit device has a pair of oscillator terminals that is respectively provided with two oscillation signals having phases opposite to each other. An oscillator circuit provides an internal circuit with a system clock signal based on the oscillation signals. A mode detection circuit detects that the pair of oscillator terminals is respectively provided with two input signals having the same phase, and provides a test circuit with a detection signal. The test circuit sets a test mode according to the detection signal, and provides the internal circuit with a predetermined test signal. By setting the test mode using a pair of external terminals, an increase in the number of external terminals of the semiconductor integrated circuit device can be prevented.

REFERENCES:
patent: 5065091 (1991-11-01), Youichi
patent: 5612963 (1997-03-01), Henriksson et al.
patent: 5903512 (1999-05-01), Bozidar et al.
patent: 2002/0129234 (2002-09-01), Pascal et al.
patent: 6-309475 (1994-11-01), None

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