Semiconductor integrated circuit device

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Reexamination Certificate

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C365S227000

Reexamination Certificate

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07042787

ABSTRACT:
A semiconductor integrated circuit device with a power-on detecting circuit, wherein the power-on detecting circuit includes: first and second power supply terminals between which an external power supply voltage is to be supplied; a first diode circuit having a first resistor and a first diode connected in series between the first and second power supply terminals, an interconnect node between the first resistor and first diode serving as a first voltage detecting node; a second diode circuit having second and third resistors and a second diode connected in series between the first and second power supply terminals, the second diode having a current drivability larger than the first diode, an interconnect node between the second and third resistors serving as a second voltage detecting node; and a first comparator for detecting a voltage of the second voltage detecting node becoming higher than that of the first voltage detecting node to output a power-on signal.

REFERENCES:
patent: 5278792 (1994-01-01), Inoue et al.
patent: 5814995 (1998-09-01), Tasdighi
patent: 5894446 (1999-04-01), Itou
patent: 6204703 (2001-03-01), Kwon
patent: 6882570 (2005-04-01), Byeon et al.
patent: 2003/0095437 (2003-05-01), Imamiya
patent: 2003-162453 (2003-06-01), None

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