Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

2005-08-16

2005-08-16

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C324S1540PB

Reexamination Certificate

active

06930504

ABSTRACT:
A semiconductor integrated circuit device is provided which includes a first circuit block connected to a first node and a second circuit block connected to a second node, wherein the second circuit block is provided on the same semiconductor chip as the first circuit block. A comparator is also provided to compare a first potential of the first node and a second potential of the second node. A first supply current in a quiescent state flows through the first node and the first circuit block, and a second supply current in a quiescent state flows through the second node and the second circuit block.

REFERENCES:
patent: 6281699 (2001-08-01), Bishop
patent: 6366108 (2002-04-01), O'Neill et al.
patent: 6756804 (2004-06-01), Ishibashi
patent: 6-58981 (1994-03-01), None

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