Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

2005-07-12

2005-07-12

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S765010, C324S754090, C438S017000, C714S719000

Reexamination Certificate

active

06917213

ABSTRACT:
An input/output pin for test corresponding to a test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section. The selection switches are respectively provided between the relevant analog pin and analog circuit and on a signal line up to the test circuit of the digital section from the relevant analog pin and the switches are provided at both end portions of the signal line between the test circuit of digital section and the input/output pin for common use in order to fix the voltage of the signal line to the predetermined voltage such as the ground voltage during the normal operation. Thereby, it is possible in a semiconductor integrated circuit having the analog and digital sections to eliminate adverse effect, even if the input/output pin for testing corresponding to the test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section, from the analog circuit due to the noise which is generated in the digital section and is then transferred to the analog circuit through the signal path up to the analog input/output pin connected to the test circuit from this test circuit of the digital section.

REFERENCES:
patent: 5900739 (1999-05-01), Gaglani
patent: 6298458 (2001-10-01), Cranford, Jr. et al.

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