Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2008-03-27
2009-12-15
Young, Brian (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000
Reexamination Certificate
active
07633416
ABSTRACT:
A semiconductor integrated circuit includes a test signal generating section which generates a test signal at the time of a test, a digital-analog converter which converts the test signal into an analog signal, an analog-digital converter which fetches a signal output from the digital-analog converter and converts the fetched signal into a digital signal, and an operating section which performs an auto-correlation arithmetic operation of a signal output from the analog-digital converter. The semiconductor integrated circuit further includes an evaluating section which evaluates presence/absence of distortion of the digital-analog converter and the analog-digital converter based on consistency of an auto-correlation arithmetic operation result in the operating section and a predetermined reference signal.
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Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Young Brian
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