Semiconductor integrated circuit and test method for characteris

Details Semiconductor integrated circuit and test method for characteris Semiconductor integrated circuit and test method for characteris

1989-01-27

1991-04-02

Miller, Stanley D.

Electrical transmission or interconnection systems

Personnel safety or limit control features

Interlock

328167, 357 40, H03K 333, H03K 3335

Patent

active

050049348

ABSTRACT:
A semiconductor integrated circuit includes a circuit that has characteristics that can be changed by an electrical signal supplied from the outside of the integrated circuit. An output terminal that is used during the normal action of the semiconductor circuit is used as the output of the filter when testing the characteristics of the filter. A switching from the output terminal during normal action and during testing of the filter is performed by a plural mode switch.

REFERENCES:
patent: 4797578 (1989-01-01), Eriksson

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