Semiconductor integrated circuit and method of testing...

Details Semiconductor integrated circuit and method of testing... Semiconductor integrated circuit and method of testing...

2007-02-27

2007-02-27

Barron, Gilberto (Department: 2134)

Cryptography

Equipment test or malfunction indication

Reexamination Certificate

active

09867766

ABSTRACT:
Confidential CRC codewords are stored along with confidential data words on a ROM. A checker subjects one of the confidential data words, which has been read out from the ROM, to the same type of calculation as a predetermined calculation that was carried out to produce associated one of the confidential CRC codewords. A comparator compares a result of the calculation performed by the checker to the associated confidential CRC codeword that has been read out from the ROM.

REFERENCES:
patent: 4438512 (1984-03-01), Hartung et al.
patent: 4805173 (1989-02-01), Hillis et al.
patent: 4809279 (1989-02-01), Kim et al.
patent: 4905142 (1990-02-01), Matsubara et al.
patent: 5671394 (1997-09-01), Katsuta
patent: 5802592 (1998-09-01), Chess et al.
patent: 5860099 (1999-01-01), Milios et al.
patent: 6006354 (1999-12-01), McGuinness
patent: 6185678 (2001-02-01), Arbaugh et al.
patent: 6490685 (2002-12-01), Nakamura
patent: 195 34 783 (1996-11-01), None
patent: 57-006491 (1982-01-01), None
patent: 60-30000 (1985-02-01), None
patent: 11-175403 (1999-07-01), None

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