Semiconductor integrated circuit and method of designing...

Details Semiconductor integrated circuit and method of designing... Semiconductor integrated circuit and method of designing...

2008-05-21

2011-11-08

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Physical design processing

C716S111000, C716S112000

Reexamination Certificate

active

08056036

ABSTRACT:
A method of designing a semiconductor integrated circuit based on the TPI technique, comprising: (A) selecting a target node from a plurality of nodes included in a design circuit; (B) inserting a test point at the target node; (C) designating a delay time with respect to a test point path that is a path connected to the test point; and (D) laying out the design circuit such that a delay time of the test point path becomes the designated delay time. The (A) selecting includes: (A1) calculating delay times of fan-in paths and fan-out paths with respect to each of the plurality of nodes; and (A2) selecting the target node from the plurality of nodes based on the calculated delay times.

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