Semiconductor integrated circuit, and electrostatic...

Details Semiconductor integrated circuit, and electrostatic... Semiconductor integrated circuit, and electrostatic...

2007-04-17

2007-04-17

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

10875624

ABSTRACT:
An electrostatic withstand voltage test method that enables semiconductor integrated circuit testing to be performed with a high degree of precision and at low cost. In this method, with one of ground pins VSS and VSSI of a semiconductor integrated circuit100grounded, static electricity is applied from a static electricity discharge apparatus102to all pins of semiconductor integrated circuit100, after which, with power supply apparatus106connected to power supply pin VDD of semiconductor integrated circuit100and the other grounded, a leakage current test apparatus116is connected to all signal pins and pin leakage current is tested, and with ground pin VSSI of the internal circuitry of semiconductor integrated circuit100grounded and leakage current test apparatus104connected to power supply pin VDDI, a pattern generator105that supplies a digital signal is connected to signal input pins (IN, I/O), and power supply leakage current is tested.

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