Semiconductor integrated circuit and device and method for...

Details Semiconductor integrated circuit and device and method for... Semiconductor integrated circuit and device and method for...

2006-06-01

2008-10-21

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07439754

ABSTRACT:
An accelerated test for transistors included in inverter circuits of a semiconductor integrated circuit is to be improved in efficiency. Output terminals30A,30B of inverter circuits11, 12, each including a CMOS circuit, may be short-circuited. A test circuit20supplies signals of mutually exclusive logical values to the inverter circuits11, 12, whose output terminals30A,30B are in a short-circuited state. For testing, a switch50is turned on to short-circuit the output terminal30A,30B and signals of opposite logical levels are alternately supplied to the inverter circuits11, 12to cause the current to flow alternately through N-channel MOS transistors and P-channel MOS transistors included in the two CMOS circuits to activate the circuits.

REFERENCES:
patent: 7212027 (2007-05-01), Ishibashi et al.
patent: 7298656 (2007-11-01), Minzoni
patent: 7-58172 (1995-03-01), None
patent: 2002-314394 (2002-10-01), None

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