Semiconductor integrated circuit and associated test method

Details Semiconductor integrated circuit and associated test method Semiconductor integrated circuit and associated test method

1992-06-02

1994-05-31

Westin, Edward P.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

3072722, 371 223, H03K 3289

Patent

active

053172051

ABSTRACT:
A semiconductor integrated circuit includes a sequential circuit including a plurality of flip-flops which latch and keep data supplied to an input terminal at a prescribed timing and which perform prescribed sequential treatments of the input data, and a combinational circuit implemented at the input and/or output terminals of the sequential circuit and which performs a prescribed combinational treatment or treatments of the input and/or output data to and/or from the sequential circuit. The semiconductor integrated circuit also includes a data-through circuit operated by an external control signal configured to transfer the data supplied to the input terminal direct to an output terminal of a prescribed flip-flop of the plurality flip-flops constituting the sequential circuit.

REFERENCES:
patent: 4580137 (1986-04-01), Fiedler
patent: 5105100 (1992-04-01), Yamada
patent: 5122738 (1992-06-01), Simpson
patent: 5130568 (1992-07-01), Miller

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