Semiconductor integrated circuit and a method of testing the sam

Details Semiconductor integrated circuit and a method of testing the sam Semiconductor integrated circuit and a method of testing the sam

1991-09-30

1993-09-28

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 225, G01R 1512

Patent

active

052489361

ABSTRACT:
A semiconductor integrated circuit has a main circuit (1), a self testing circuit (2) for testing the main circuit (1), a test start signal detection circuit (5) having at least one light sensitive device for detecting a test start signal in the form of light, and a test result output circuit (4) having at least one light emitting device for outputting test results from the self testing circuit (2) in the form of light. A drastic reduction in test time is accomplished by applying the test start signal in a non-contacting manner to the semiconductor integrated circuit so as to activate the self testing circuit. Furthermore, the test result is output to the outside of the semiconductor integrated circuit without having to provide electrical connections, and the simultaneous testing of a greater number of semiconductor integrated circuits as formed on the same wafer can be accomplished.

REFERENCES:
patent: 4684884 (1987-08-01), Soderlund
patent: 4714876 (1987-12-01), Gay et al.
patent: 4833395 (1989-05-01), Sasaki et al.
patent: 5097206 (1992-03-01), Perner
patent: 5130645 (1992-07-01), Levy
T. Takeshima et al., "A 55-ns 16 Mb DRAM with Built-in Self-Test Function Using Microprogram ROM", IEEE Journal of Solid-State Circuits, vol. 25, No. 4, pp. 903-909 (Aug. 1990).
T. Takeshima et al., "A 55ns 16 Mb DRAM", for ISSCC Digest of Technical Papers, at pp. 246-247 (1989).
"2.3 Built-In Test", from Built-In Test For VLSI, Wiley-Interscience, at pp. 38-43.
H. Koike et al, "A 55ns 16Mb DRAM w/ Built-In Self-Test Function Using Micro-Program ROM", pp. 79-85 Electronics, Information & Communication Engineers (w/ partial English translation), 1989.

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