Semiconductor integrated circuit allowing proper detection...

Details Semiconductor integrated circuit allowing proper detection... Semiconductor integrated circuit allowing proper detection...

2005-05-31

2005-05-31

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S763010

Reexamination Certificate

active

06900628

ABSTRACT:
In a pin contact test, a voltage across an external pin is measured by setting a voltage to be supplied to the power supply nodes in input protection circuits in their respective chips at a prescribed amount by means of voltage control circuits and by supplying a prescribed constant current to external pin. Based on the measurement results, a pin contact failure in chips can be detected.

REFERENCES:
patent: 4346309 (1982-08-01), Garrett et al.
patent: 5514976 (1996-05-01), Ohmura
patent: 6292342 (2001-09-01), Miyamoto
patent: 6-331705 (1994-12-01), None
patent: 2001-13215 (2001-01-01), None
patent: 1999-002518 (1999-01-01), None

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