Semiconductor integrated circuit adapted for a current-leak test

Details Semiconductor integrated circuit adapted for a current-leak test Semiconductor integrated circuit adapted for a current-leak test

1993-11-23

1995-05-02

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 226, G01R 3128

Patent

active

054123151

ABSTRACT:
A semiconductor circuit adapted for a current leak testing has a first circuit operated by a large current and a second circuit operated by a small current. The small current refers to a current required by an ordinary semiconductor integrated circuit (IC) having only digital logic, and the large current refers to at least an order of tens the small current. The circuit generates an operation mode signal of a first logic level when performing a current-leak test of the IC and outputs an operation mode signal of a second logic level otherwise. Operation of the first circuit is inhibited and the output fixed at a prescribed logic level when the operation mode signal is of the first logic level. A third circuit equivalent to the first circuit when the first circuit is in normal operation receives a data signal identical to the first circuit and is operated by a small current. A selection circuit transmits the output of the first circuit to an internal circuit of the IC when the operation mode signal is of the second logic level and transmits the output of the third circuit to the internal circuit when the operation mode signal is of the first logic level.

REFERENCES:
patent: 4697140 (1987-09-01), Saito
patent: 5294883 (1994-03-01), Akiki

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