Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

1982-12-29

1986-04-15

Gruber, Felix D.

Boots, shoes, and leggings

364490, 365200, 371 10, 371 25, G06F 1130, G11C 1140, G01R 19165

Patent

active

045831793

ABSTRACT:
A semiconductor integrated circuit which includes therein at least one inspection circuit for inspecting a voltage level produced at an internal node to be inspected. The inspection circuit has at least a control signal input portion connected to the internal node to be inspected and an input part connected to an external input/output pin. The inspection circuit includes a series-connected transistor and diode connected between a power source and the input portion, a capacitor connected between a gate of the transistor and the input portion, and a transfer gate transistor connected between the control signal input portion and the gate of the transistor. The inspection circuit discriminates the level at the internal node according to a flow or nonflow of a current, via the external input/output pin, when a particular signal having a voltage level higher than the power source level is supplied to the external input/output pin.

REFERENCES:
patent: 4047163 (1977-09-01), Choate et al.
patent: 4051460 (1977-09-01), Yamada et al.
patent: 4281398 (1981-07-01), McKenny et al.
patent: 4346459 (1982-08-01), Sud et al.
patent: 4376300 (1983-03-01), Tsang
patent: 4380066 (1983-04-01), Spencer et al.
patent: 4422161 (1983-12-01), Kressel et al.
patent: 4441170 (1984-04-01), Folmsbee et al.
patent: 4446534 (1984-05-01), Smith
patent: 4480199 (1984-10-01), Varshney et al.
IEEE International Solid-State Circuits Conference, "Memories and Redundancy Techniques", by K. D. Wise, ISSCC 81, Session VIII, Feb. 18, 1981, pp. 79-85.
IBM Technical Disclosure Bulletin, "Maximized LSSD Test I/O Pin Usage", by W. P. Whitley, vol. 24, No. 2, Jul. 1981, pp. 1193-1194.

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1443121