Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-09-17
1989-08-15
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
371 15, 371 20, G01R 3128
Patent
active
048578347
ABSTRACT:
A semiconductor integrated circuit comprises a digital circuit for performing a signal process and producing a digital signal, a digital/analog converter for converting the digital signal produced by said digital circuit into an analog signal, and logic means for extracting a predetermined number of bits from the digital signal upon a test mode. The semiconductor integrated circuit further comprises a switching circuit for selecting either one of the digital signal from said digital circuit and the analog signal from said digital/analog converter on the basis of a non-test mode or test mode, and for providing an external circuit with a selected signal, and a test controlling circuit for designating either one of said test and non-test modes and providing said logic means and switching circuit with a mode signal.
REFERENCES:
patent: 4272721 (1981-06-01), Beeman
patent: 4417151 (1983-11-01), Klein et al.
patent: 4441183 (1984-04-01), Dussault
patent: 4583223 (1986-04-01), Inoue et al.
Fujitsu Limited
Karlsen Ernest F.
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