Semiconductor integrated circuit

Static information storage and retrieval – Powering – Conservation of power

Reexamination Certificate

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Details

C365S154000, C365S226000

Reexamination Certificate

active

11048932

ABSTRACT:
Data breakdown due to fluctuation of an operation power source is suppressed by suppressing a sub-threshold leakage current. A semiconductor integrated circuit includes a pair of power source wires, a plurality of static memory cells, a voltage control circuit for controlling an operation voltage applied from the power source wires to the static memory cells, a monitor circuit for monitoring a voltage of the power source wires and a mode control circuit for controlling a plurality of operation modes. The monitor circuit can detect a change of decrease of a potential difference between the pair of power source wires. The voltage control circuit can execute control in such a manner as to reduce the potential difference of a pair of power source nodes of the static memory cell in response to indication of the low power consumption mode by the mode control circuit and can execute control in such a manner as to increase the potential difference of the pair of power source nodes of the static memory cell in response to detection of the decrease of the potential difference between the pair of power source wires by the monitor circuit.

REFERENCES:
patent: 5563839 (1996-10-01), Herdt et al.
patent: 5734604 (1998-03-01), Akamatsu et al.
patent: 6603345 (2003-08-01), Takahashi

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