Semiconductor integrated circuit

Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing

Reexamination Certificate

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C323S907000

Reexamination Certificate

active

06906902

ABSTRACT:
A semiconductor integrated circuit comprises a transistor which has a first electrode, a second electrode and a third electrode, said transistor conducting a current of a first power source from the second electrode to the third electrode by a power supplied to the first electrode; a driver to supply said first electrode with power for driving said transistor; a reference voltage circuit to generate a reference voltage which is variable in response to temperature of said transistor, said reference voltage being used as the reference for comparison; a comparative voltage circuit to generate a comparative voltage which is variable in response to a current flowing from said second electrode to said third electrode, said comparative voltage being compared with said reference voltage; and a controller which receives said reference voltage and said comparative voltage and which supplies a control signal to said driver, said control signal being based on a result of the comparison between the comparative voltage and the reference voltage to control the power supplied to said first electrode.

REFERENCES:
patent: 4355344 (1982-10-01), Felici et al.
patent: 4669026 (1987-05-01), Widlar
patent: 4937697 (1990-06-01), Edwards et al.
patent: 5008771 (1991-04-01), Palara
patent: 5390069 (1995-02-01), Marshall
patent: 5428287 (1995-06-01), Agiman
patent: 5838187 (1998-11-01), Embree

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