Semiconductor integrated circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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Details

C327S158000

Reexamination Certificate

active

06911850

ABSTRACT:
In a semiconductor integrated circuit including a phase comparison circuit for a DLL in a reception circuit for receiving serial digital transmission signals, phase detection characteristics of the phase comparison circuit are improved while preventing false lock so as to improve response speed and locking accuracy of the DLL as a whole. The semiconductor integrated circuit includes series-connected delay elements each having a delay time which is controlled in accordance with a control voltage, a phase comparison circuit for generating a voltage corresponding to a phase difference between a clock signal input to a predetermined one of the delay elements and a clock signal output from another predetermined one of the delay elements, a control circuit for controlling the phase comparison circuit to generate a predetermined voltage when said phase difference is within a predetermined range, and a filter circuit for filtering the voltage generated by the phase comparison circuit to generate the control voltage to be applied to the delay elements.

REFERENCES:
patent: 5994934 (1999-11-01), Yoshimura et al.
patent: 6157263 (2000-12-01), Lee et al.
patent: 6411142 (2002-06-01), Abbasi et al.
patent: 6441662 (2002-08-01), Ikeda
patent: 2002-022524 (2000-01-01), None

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