Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2005-01-18

2005-01-18

Phung, Anh (Department: 2824)

Optics: measuring and testing

Refraction testing

Prism engaging specimen

C365S205000, C365S222000

Reexamination Certificate

active

06844926

ABSTRACT:
There is disclosed a semiconductor integrated circuit in which an equalize circuit is connected between input nodes N1, bN1of a differential sense amplifier. A latch circuit is connected between nodes N2, bN2. A data change circuit is connected between the nodes N1and bN2and between the nodes bN1and N2. A disconnection circuit is connected between the nodes N1and N2and between the nodes bN1and bN2. In a state in which potentials of the input nodes N1, bN1are equal to each other, the differential sense amplifier is operated, and output data of the amplifier is reversed by the data change circuit and subsequently latched by the latch circuit. The latched data is supplied to the input nodes N1, bN1of the differential sense amplifier.

REFERENCES:
patent: 6130845 (2000-10-01), Ootsuki et al.
patent: 6373745 (2002-04-01), Saito et al.
patent: 6418073 (2002-07-01), Fujita
patent: 6466501 (2002-10-01), Kim et al.
patent: 6473358 (2002-10-01), Noda et al.
Kerry Bernstein, et al., “SOI Circuit Design Concepts”, IBM Microelectronics, Chapter 6.3, pp. 124-129.

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